Paper Group ANR 276
April 2, 2020
Accurate Stress Assessment based on functional Near Infrared Spectroscopy using Deep Learning Approach. Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans. Adversarial vs behavioural-based defensive AI with joint, continual and active learning: automated evaluation of robustness to deception, poisoning and c …